Features & Benefits

• Precise cross-sectioning at the TEM level
• Repeatable ａnd rapid production of TEM samples
• Reduces ion milling time to minutes as opposed to hours
• Produces large thin areas over the entire specimen

Operation - Standard Technique

The PELCO^® Tripod Polisher™ 590 can be used to prepare a sample for both SEM ａnd TEM cross-sectional analysis. To accomplish this, the sample is mounted on the face of a special SEM stub which is clamped into the slotted L-bracket of the PELCO^® Tripod Polisher™ 590. Initial grinding is done on a 15μm metal bonded diamond disc. Further lapping ａnd polishing continues with a succession of diamond films ranging in size from 30μm to 0.5μm. The final polish is done with a colloidal silica suspension. As lapping progresses, the two rear micrometers are used to adjust the plane of polish. With periodic examinations in an inverted microscope, the plane of polish is adjusted until it is parallel to the plane of interest. At this point the SEM stub may be moved to an ion mill for a quick milling to remove fine scratches, polishing debris ａnd to give the surface ography prior to SEM analysis. The SEM stub can be mounted directly in the SEM for analysis. When analysis is complete, a TEM sample of the same area is made. The sample is removed from the SEM stub ａnd attached to a single aperture TEM grid. The slotted L-bracket is removed ａnd the TEM grid is attached to the round sample mount which is affixed to the center of the polisher. The sample is now mechanically thinned using Diamond Lapping Film. During this process the sample is periodically examined in an inverted microscope and the micrometers are adjusted to maintain the correct plane of polish. The sample is FINAL polished to 1μm or less ａnd then ion milled for up to 15 minutes.

Operation - Wedge Technique

Wedge polishing technique can be used either in conjunction with ion milling (common for cross-sections) or electropolishing, or in some cases where preferential thinning, amorphization, ａnd ography that can occur in ion-milled samples is unacceptable, mechanically polish the sample to electron transparency. With this technique the SEM stub is replaced, in the slotted L-bracket, with a Pyrex^® insert. The sample is mounted on the bottom of the ｉnsert ａnd the two rear micrometers are adjusted ａnd the micrometer nearest the sample is retracted to produce a wedge shape as material is removed from the sample. The typical wedge angle is 1.5-2 degrees. The sample, with the features of interest at the apex of the wedge, is thinned until the area of interest is 3-5um thick if final polishing by other methods or ~1μm thick if mechanically finishing, on a succession of diamond lapping films. The sample is then final polished, either mechanically on a final polishing cloth such as our MultiTex Cloth (#816-12) with a colloidal silica suspension, or glued to a single aperture TEM grid ａnd removed from the Pyrex^® ｉnsert for final polishing by other methods.